There is a vast variety of contemporary surface analysis methods that you can use for your research. If you are not sure which one is right for you, or if you want to obtain the right information about different surface analysis techniques, then this course is for you!
About this Course
Offered by

National Research Nuclear University MEPhI
National Research Nuclear University “MEPhI” is one of the most recognized technical universities in Russia. It is the only research nuclear university in Russia. The aim of the university existence is preparing the specialists for nuclear industry, science, information technology and other high-tech sectors of Russian economy.
Syllabus - What you will learn from this course
Introduction
Module 1 gets the students familiar with the main features of modern surface analysis methods and values, which they could provide. Question-answer concept. An interesting correlation between analytical spot size and composition accuracy is shown and explained.
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.
Particle Diagnostics. Rutherford Backscattering
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In a family of RBS, ERD and partially NRA methods simple Newtonian laws of elastic collisions lead to a precise knowledge of surface composition. A tiny bit of nuclear physics is present in the NRA method though it shares basic principles with RBS and ERD.
Electron Diagnostics. Spectroscopy
These methods use an electron beam as primary. Knowing the all the atoms have their signature band structure on can use that knowledge to identify the elements with AES and EDS methods. They both need a primary electron beam and they both rely on creating vacancies in the core energy leveles and filling of these vacancies with higher level electrons. In AES Auger electron energies are measured as they are emitted from the specimen. In EDS characteristic X-ray photon energies are measured. Both give information on the sample composition though in a different way, yet having the same starting processes.
Electron Diagnostics. Microscopy
One could not mention electron microscopes when talking about electron diagnostics. TEM and SEM are discussed, and their basic principles exposed. Methods of obtaining better quality images are shown.
Reviews
TOP REVIEWS FROM METHODS OF SURFACE ANALYSIS
A great intermediate course on Surface analysis techniques using various microscopes and spectroscopic techniques. A great deal of knowledge for people belonging to materials science background.
It was a fun course with lot of critical thinking involved. Methods and their uses are given in great detail, which would definitely prove helpful when using the instrument practically.
Very good for researchers, those who are finding difficulty in choosing right tool for surface analysis. Instructor was good and content also with right graphic, makes interesting.
Very useful and good course. the lecturer was very well. one of the best side of this course was to give slide documents unlike other courses.
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