SIMS: Basic Principles and Components

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May 31, 2021

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Excellent course. It helped me a lot to to get the idea of the most of the concepts which are very necessary for my current research.

KR

Apr 7, 2020

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I am currently doing research on thin film. This course is going to help me a lot. Thanks a lot to the Professor. He is amazing.

From the lesson

Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)

This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

Taught By

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    Sadovsky Yaroslav

    Assistant

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