Micro Computed Tomography: Measurement Demonstration

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SQ

Sep 18, 2019

This is a very informative course for scientists and researchers especially working in materials science and engineering. I would gladly recommend this course to my research fellows

AR

Mar 05, 2019

Topics covered and concepts were precise, to the point and well explained. Both practical and theoretical aspects were taught which is very rare to receive in an online course.

From the lesson
Nano Measurement and Characterization Tools: X-ray and Optical Characterization
In this module, we will see demonstrations of micro-computed tomography, X-ray photoelectron spectroscopy, and optical spectroscopy. You will learn the basic function of the equipment and how samples are prepared and measured.

Taught By

  • Nan M. Jokerst

    Nan M. Jokerst

    J. A. Jones Professor of Electrical and Computer Engineering
  • Carrie Donley

    Carrie Donley

    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)
  • James Cahoon

    James Cahoon

    Assistant Professor
  • Jacob Jones

    Jacob Jones

    Professor

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