Arizona State University
Semiconductor Characterization Specialization
Arizona State University

Semiconductor Characterization Specialization

Learn to Characterize Semiconductors. Explore electrical, electron beam, ion beam, x-ray, and optical measurement techniques for workplace application.

Trevor Thornton

Instructor: Trevor Thornton

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4.8

(36 reviews)

Intermediate level

Recommended experience

1 month
at 10 hours a week
Flexible schedule
Learn at your own pace
Get in-depth knowledge of a subject
4.8

(36 reviews)

Intermediate level

Recommended experience

1 month
at 10 hours a week
Flexible schedule
Learn at your own pace

What you'll learn

  • Students will identify characteristics of complementary metal-oxide semiconductor (CMOS) materials and devices.

  • Students will distinguish among different types of semiconductor characterization.

  • Students will apply their understanding of different measurement techniques to real-world situations.

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Taught in English

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Specialization - 5 course series

Fundamentals of Semiconductor Characterization

Course 15 hours4.9 (32 ratings)

What you'll learn

  • Review energy band diagrams of metals, semiconductors, and insulators.

  • Explain the relationship between conductivity, carrier concentration, and mobility.

  • Distinguish between direct and indirect bandgap semiconductors.

Skills you'll gain

Category: Semiconductor Device
Category: Complementary Metal Oxide Semiconductor (CMOS)
Category: Semiconductors
Category: Semiconductor Characterization Techniques
Category: Semiconductor Materials
Category: Semiconductor Device Physics

Electrical Characterization: Diodes

Course 24 hours4.6 (11 ratings)

What you'll learn

  • Define resistance, resistivity, and sheet resistance and their associated units.

  • Describe how to perform four-point probe current-voltage measurements.

  • Explain the use of the transfer length method.

Skills you'll gain

Category: Semiconductor Device
Category: Complementary Metal Oxide Semiconductor (CMOS)
Category: Semiconductors
Category: Semiconductor Characterization Techniques
Category: Semiconductor Materials
Category: Semiconductor Device Physics

What you'll learn

  • Extract characteristic parameters of MOS capacitors.

  • Extract characteristic parameters of MOSFETs.

  • Analyze real-world MOSFET data.

Skills you'll gain

Category: Semiconductor Device
Category: Complementary Metal Oxide Semiconductor (CMOS)
Category: Semiconductors
Category: Semiconductor Characterization Techniques
Category: Semiconductor Materials
Category: Semiconductor Device Physics

What you'll learn

  • Explain the interaction of electron and ion beams with semiconductor materials.

  • Describe the constituent components of electron and ion beam characterization systems.

  • Describe applications of electron and ion beam characterization.

Skills you'll gain

Category: Semiconductor Device
Category: Complementary Metal Oxide Semiconductor (CMOS)
Category: Semiconductors
Category: Semiconductor Characterization Techniques
Category: Semiconductor Materials
Category: Semiconductor Device Physics

Optical and X-Ray Characterization

Course 54 hours4.8 (13 ratings)

What you'll learn

  • Describe the use of light to measure the thickness and refractive index of thin transparent films.

  • Explain how light is absorbed and emitted by semiconductors.

  • Explain the advantages and limitations of optical and X-ray characterization.

Skills you'll gain

Category: Semiconductor Device
Category: Complementary Metal Oxide Semiconductor (CMOS)
Category: Semiconductors
Category: Semiconductor Characterization Techniques
Category: Semiconductor Materials
Category: Semiconductor Device Physics

Instructor

Trevor Thornton
Arizona State University
5 Courses2,635 learners

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