KN
5.0Reviewed May 8, 2024
Quick introduction and review of important topics. I wish if more such courses are introduced.
Quick introduction and review of important topics. I wish if more such courses are introduced.
Optical and X-Ray Characterization
Optical and X-ray techniques are powerful ways to characterize semiconductor thin films. They can be used to measure film thickness, purity and crystalline quality, and for compositional analysis. Modern techniques are fast, turn-key, and generally non-destructive, allowing for rapid assessment of material properties. This course describes the fundamentals of optical and X-ray characterization and provides real-world examples of how they are used in semiconductor manufacturing.
Status: Analytical Chemistry
Status: Semiconductors
IntermediateCourse4 hours
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Kuna Lakshun Naidu
5.0
Reviewed May 9, 2024Roy David Moya Serrano
5.0
Reviewed Jan 11, 2025Excellent course; I have learned a lot, thanks
Carter Hung
5.0
Reviewed May 14, 2024Very practical and useful, thanks!
Mike Bowyer
5.0
Reviewed Apr 8, 2025Enjoyed the courses very much!
Zahid Ullah
5.0
Reviewed Dec 18, 2023best course
Haroon Khan
4.0
Reviewed Jul 26, 2025v.good
Ian Binnie
2.0
Reviewed Jun 9, 2024I do semiconductor and materials characterization for a living. so this course was too basic in my opinion, its an ok introduction to some of the instruments. Would be nice if there was more exercises like the one used for the solar cell roughness project.