Optical and X-Ray Characterization
Completed by Jui-tse Hung
May 14, 2024
4 hours (approximately)
Jui-tse Hung's account is verified. Coursera certifies their successful completion of Optical and X-Ray Characterization
What you will learn
Describe the use of light to measure the thickness and refractive index of thin transparent films.
Explain how light is absorbed and emitted by semiconductors.
Explain the advantages and limitations of optical and X-ray characterization.
Skills you will gain
- Category: Materials science
- Category: Systems Of Measurement
- Category: Laboratory Equipment
- Category: Laboratory Testing
- Category: Laboratory Techniques
- Category: Semiconductors
- Category: Analytical Testing
- Category: Analytical Chemistry
- Category: Structural Analysis
