Optical and X-Ray Characterization
Completed by Jinlin YANG
July 1, 2025
4 hours (approximately)
Jinlin YANG's account is verified. Coursera certifies their successful completion of Optical and X-Ray Characterization
What you will learn
Describe the use of light to measure the thickness and refractive index of thin transparent films.
Explain how light is absorbed and emitted by semiconductors.
Explain the advantages and limitations of optical and X-ray characterization.
Skills you will gain
- Category: Analytical Testing
- Category: Semiconductors
- Category: Laboratory Techniques
- Category: Analytical Chemistry
- Category: Systems Of Measurement
- Category: Laboratory Equipment
- Category: Materials science
- Category: Laboratory Testing
- Category: Structural Analysis
