Optical and X-Ray Characterization
Completed by Leonardo E. Jimenez-Rodriguez
July 27, 2026
4 hours (approximately)
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What you will learn
Describe the use of light to measure the thickness and refractive index of thin transparent films.
Explain how light is absorbed and emitted by semiconductors.
Explain the advantages and limitations of optical and X-ray characterization.
Skills you will gain
- Category: Materials science
- Category: Engineering, Scientific, and Technical Instruments
- Category: Structural Analysis
- Category: Laboratory Equipment
- Category: Semiconductors
- Category: Laboratory Techniques
- Category: Laboratory Testing
- Category: Analytical Chemistry
- Category: Analytical Testing
