Optical and X-Ray Characterization
Completed by Michael Mooney
December 8, 2024
4 hours (approximately)
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What you will learn
Describe the use of light to measure the thickness and refractive index of thin transparent films.
Explain how light is absorbed and emitted by semiconductors.
Explain the advantages and limitations of optical and X-ray characterization.
Skills you will gain
- Category: Structural Analysis
- Category: Laboratory Testing
- Category: Materials science
- Category: Analytical Testing
- Category: Laboratory Equipment
- Category: Laboratory Techniques
- Category: Semiconductors
- Category: Laboratory Experience
